Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Extrusion failure monitor structures

Extrusion failure monitor structures

US Patent 7683644 · Granted Mar 23, 2010

Estimated economic value: $4,775,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconducting devices, back end of line portions for semiconducting devices, an2025
Membrane system to treat leachate and methods of treating leachate2024
Membrane system to treat leachate and methods of treating leachate2022
IC structure with interdigitated conductive elements between metal guard structu2020
Parallel test structure2019
Mechanically anchored C4 pad and method of forming same2019
Wafer rigidity with reinforcement structure2019
Membrane system to treat leachate and methods of treating leachate2019
Interconnect structures for a security application2019
Interconnect structure having subtractive etch feature and damascene feature2019
Stacked via structure for metal fuse applications2019
Forming air gap2019