Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test apparatus and method for testing a circuit unit

Test apparatus and method for testing a circuit unit

US Patent 7574643 · Granted Aug 11, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for masking known fails during memory tests readouts2009
Memory module, test system and method for testing one or a plurality of memory m2007
Method and apparatus for calibrating a test system for an integrated semiconduct2007
Test circuit and method for testing an integrated memory circuit2007
Method and apparatus for masking known fails during memory tests readouts2006
Data generator for generating test data for word-oriented semiconductor memories2006
Test device, test system and method for testing a memory circuit2006
Dynamic memory and method for testing a dynamic memory2006
Method for testing wafers to be tested and calibration apparatus2005
Integrated semiconductor circuit configuration2005
Integrated circuit having a current measuring unit2004
Memory module with improved electrical properties2003