Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Memory module, test system and method for testing one or a plurality of memory modules

Memory module, test system and method for testing one or a plurality of memory modules

US Patent 7231562 · Granted Jun 12, 2007

Estimated economic value: $391,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for automated transfer and evaluation of the quality of mass d2011
Integrated semiconductor memory with distributor line for redundant data lines2011
Memory device having an evaluation circuit2010
Integrated electrical module with regular and redundant elements2009
Test apparatus and method for testing a circuit unit2009
Method and apparatus for masking known fails during memory tests readouts2009
Method and apparatus for masking known fails during memory tests readouts2009
Method for accessing a memory2008
Method and apparatus for checking output signals of an integrated circuit2008
Integrated memory having a test circuit for functional testing of the memory2007
Adiabatic rotational switching memory element including a ferromagnetic decoupli2007
Test circuit and method for testing an integrated memory circuit2007