Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods

Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods

US Patent 7531796 · Granted May 12, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Image recording apparatus, image recording method, and endoscope system2024
Separator for fuel cell or current collecting member for fuel cell, and solid po2023
Endoscope system and control method2021
Endoscope system and endoscope processor2021
Image processing device, image processing method, and non-transitory computer re2020
Separator for fuel cell or current collecting member for fuel cell, and manufact2020
Medical information recording device2020
ICP emission spectrophotometer2019
Medical image processing apparatus and medical image processing system2019
Method for producing fiber-reinforced resin bonded body2018
Heat transfer system for an inductively coupled plasma device2017
Sample processing evaluation apparatus2017