Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect inspecting apparatus for semiconductor wafer

Defect inspecting apparatus for semiconductor wafer

US Patent 7512501 · Granted Mar 31, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Paper sheet fitting method and paper molded article2025
Herbicidal composition2024
Pavement condition rating method2024
Information processing apparatus, image display method, and non-transitory compu2021
Defect inspection apparatus and defect inspection method2021
Non-fried potato chips2020
Information processing apparatus, information processing method, and storage med2020
SEM inspection apparatus and pattern matching method2020
Information processing apparatus and method of controlling the same2019
Three-dimensional measurement apparatus and control method for the same2019
Culture container2018
Measurement apparatus and method thereof2017