Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Fast evaluation of average critical area for IC layouts

Fast evaluation of average critical area for IC layouts

US Patent 7346865 · Granted Mar 18, 2008

Estimated economic value: $2,863,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Onboard screen casting system and method2025
Vehicle navigation image synthesis method and device, and storage medium2025
Enhanced glitch estimation in vectorless power analysis2024
Glitch source identification and ranking2023
Vector generation for maximum instantaneous peak power2022
Lithographic hotspot detection using multiple machine learning kernels2022
DRC-based hotspot detection considering edge tolerance and incomplete specificat2017
Distance metric for accurate lithographic hotspot classification using radial an2015
Distance metric for accurate lithographic hotspot classification using radial an2015
ESD/antenna diodes for through-silicon vias2015
ESD/antenna diodes for through-silicon vias2014
Banded computation architectures2014