Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › In-line voltage contrast determination of tunnel oxide weakness in integrated circuit technology development

In-line voltage contrast determination of tunnel oxide weakness in integrated circuit technology development

US Patent 7101722 · Granted Sep 5, 2006

Estimated economic value: $18,723,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Mesoporous nanocrystalline film architecture for capacitive storage devices2024
Mesoporous nanocrystalline film architecture for capacitive storage devices2020
Mesoporous nanocrystalline film architecture for capacitive storage devices2018
Mesoporous nanocrystalline film architecture for capacitive storage devices2017
Fish gripping tool2016
Mesoporous nanocrystalline film architecture for capacitive storage devices2014
Image processing in integrated circuit technology development2009
SRAM formation using shadow implantation2007
SRAM formation using shadow implantation2007
Method and apparatus for correlating semiconductor process data with known prior2007
Semiconductor device with high conductivity region using shallow trench2007
Method and apparatus for using clustering method to analyze semiconductor device2007