Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope

TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope

US Patent 7095024 · Granted Aug 22, 2006

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Clip, cover-member attachment tool, and clip assembly2025
Operating unit and amusement machine2024
Gaming machine2024
Separator for fuel cell or current collecting member for fuel cell, and solid po2023
Power distribution network monitoring system and power distribution network moni2022
Illumination device and game machine2022
Illumination device comprising a moving mechanism and a gaming machine comprisin2022
Power distribution network monitoring system for detecting abnormalities2021
Power distribution network monitoring system and power distribution network moni2021
Battery pack, power storage device, power storage system, electronic appliance, 2021
Harmonic detection system2021
Teaching compatibility determining device, system, method and recording medium2020