Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor device incorporating a defect controlled strained channel structure and method of making the same

Semiconductor device incorporating a defect controlled strained channel structure and method of making the same

US Patent 6919258 · Granted Jul 19, 2005

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical die test interface with separate voltages for adjacent electrodes2019
Optical backplane mirror2017
Optical redundancy2017
Integration of a MEMS beam with optical waveguide and deflection in two dimensio2016
Microelectronic assembly having a heat spreader for a plurality of die2016
Wirebond recess for stacked die2016
Optical wafer and die probe testing2016
Techniques for reducing inductance in through-die vias of an electronic assembly2015
Communication system die stack2015
Methods and structures for reducing heat exposure of thermally sensitive semicon2015
Die stack with optical TSVs2015
Stacked semiconductor devices2015