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Home › Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric material

Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric material

US Patent 6762613 · Granted Jul 13, 2004

Estimated economic value: $4,054,000 ⓘ

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