Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Focused beam spectroscopic ellipsometry method and system

Focused beam spectroscopic ellipsometry method and system

US Patent 6734967 · Granted May 11, 2004

Estimated economic value: $31,223,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Laser generation apparatus and sources using the same2025
Neuroprosthetic system and method for substituting a sensory modality of a mamma2025
Plasma source having a dielectric plasma chamber with improved plasma resistance2024
Multi-sensor gas sampling detection system for radical gases and short-lived mol2023
Waveguide image combiners for augmented reality displays2023
Polymer composite vacuum components2022
Multi-sensor gas sampling detection system for radical gases and short-lived mol2022
Projection night light2021
Plasma source having a dielectric plasma chamber with improved plasma resistance2021
Method and apparatus for processing dielectric materials using microwave energy2021
Toroidal plasma channel with varying cross-section areas along the channel2021
Polymer composite vacuum components2020