Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)

System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)

US Patent 6731179 · Granted May 4, 2004

Estimated economic value: $7,309,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multi-element memory device with power for individual elements2025
Timing-drift calibration2024
Protocol for memory power-mode control2024
Multi-element memory device with power control for individual elements2024
2T-1R architecture for resistive ram2024
Protocol for memory power-mode control2023
2T-1R architecture for resistive RAM2023
Multi-element memory device with power control for individual elements2022
Protocol for memory power-mode control2022
Timing-drift calibration2021
1T-1R architecture for resistive random access memory2021
2T-1R architecture for resistive RAM2021