{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Parallel test for asynchronous memory", "item": "https://www.patentleaderboard.com/patent/6111800"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Parallel test for asynchronous memory

Parallel test for asynchronous memory

US Patent 6111800 · Granted Aug 29, 2000

Estimated economic value: $54,693,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated integrated circuit design documentation2015
Floating gate reference for sleep/hibernate regulator2012
Method and apparatus to implement a reset function in a non-volatile static rand2012
Method and apparatus to program and erase a non-volatile static random access me2009
Method and apparatus to program both sides of a non-volatile static random acces2009
Method and apparatus to create an erase disturb on a non-volatile static random 2009
Method and circuit for high speed transmission gate logic2006
Architecture, method(s) and circuitry for low power memories2004
Architecture, method(s) and circuitry for low power memories2004
Parallel test in asynchronous memory with single-ended output path2003
Parallel test in asynchronous memory with single-ended output path2003
Circuit to provide a time delay2003