Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing an integrated memory device

Method and apparatus for testing an integrated memory device

US Patent 6085334 · Granted Jul 4, 2000

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Repairable latch array2024
Repairable latch array2023
Power supply monitor for detecting faults during scan testing2015
Test circuit having scan warm-up2015
Test access mechanism for multi-core processor or other integrated circuit2012
Apparatus for testing embedded memory read paths2011
Method and apparatus for affecting a portion of an integrated circuit2009
Method and apparatus for affecting a portion of an integrated circuit2007
Data processing system having an adaptive priority controller2004
Method and apparatus for verifying and characterizing data retention time in a D2001
Method and apparatus for leveraging history bits to optimize memory refresh perf2000
Method and apparatus for leveraging history bits to optimize memory refresh perf2000