Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor wafer test and burn-in

Semiconductor wafer test and burn-in

US Patent 5929651 · Granted Jul 27, 1999

Estimated economic value: $22,178,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Thin single-crystal silicon solar cells mounted to a structural support member a2024
Probe card assembly2021
Machine for augmentation, storage, and conservation of vehicle motive energy2021
Repairable rigid test probe card assembly2020
Reduction of entropic barrier of polyelectrolyte molecules in a nanopore device 2020
Reduction of entropic barrier of polyelectrolyte molecules in a nanopore device 2020
Empathy injection for question-answering systems2020
Probe card assembly2020
Solder bump array probe tip structure for laser cleaning2020
Gimbal assembly test system and method2019
Multiple contact probe head disassembly method and system2019
Organic probe substrate2019