Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Partial scan testability utilizing reconvergence through sequential elements

Partial scan testability utilizing reconvergence through sequential elements

US Patent 5502730 · Granted Mar 26, 1996

Estimated economic value: $24,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor testing device, semiconductor device, and testing method2013
Method for automated design of integrated circuits with targeted quality objecti2007
Process for automated generation of design-specific complex functional blocks to2006
Method of generating test patterns for a logic circuit, a system performing the 2001
Method for testing asynchronous circuits1999
Synthesis of low power linear digital signal processing circuits using activity 1998
Process for the preparation of an extract from human placenta containing glycosp1997
High level synthesis for partial scan testing1996
Initializable asynchronous circuit design1996