Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8441277 | Semiconductor testing device, semiconductor device, and testing method | Koichiro Noguchi, Yoshio Kameda, Koichi Nose, Masayuki Mizuno | 2013-05-14 |
| 6334199 | Method of generating test patterns for a logic circuit, a system performing the method, and a computer readable medium instructing the system to perform the method | Tamaki Toumiya | 2001-12-25 |
| 5502730 | Partial scan testability utilizing reconvergence through sequential elements | Rabindra K. Roy | 1996-03-26 |