Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11069602 | Package and terminal arrangement for semiconductor module | Shuhei Yokoyama, Shogo Shibata, Maki Hasegawa, Shigeru Mori, Toru Iwagami | 2021-07-20 |
| 10998902 | Semiconductor module and semiconductor package | Kazuhiro KAWAHARA | 2021-05-04 |
| 10812062 | Driving device for semiconductor element | Haruhiko Murakami, Ryo Goto, Shiori UOTA, Motoki Imanishi | 2020-10-20 |
| 10630279 | Power semiconductor device | Kazuhiro KAWAHARA | 2020-04-21 |
| 10333514 | Power module | — | 2019-06-25 |
| 10305468 | Semiconductor device | Koichi Nose, Yoshifumi Ikenaga, Yoichi Yoshida | 2019-05-28 |
| 10230275 | Power supply device, and control method of power supply device | Koichi Nose, Yoshifumi Ikenaga, Yoichi Yoshida | 2019-03-12 |
| 10033372 | Semiconductor device | Koichi Nose, Yoshifumi Ikenaga, Yoichi Yoshida | 2018-07-24 |
| 9965418 | Semiconductor device, semiconductor system including the same, control method of semiconductor device, and check list generation program | — | 2018-05-08 |
| 9906079 | Power supply circuit | Koichi Nose, Yoshifumi Ikenaga, Yoichi Yoshida | 2018-02-27 |
| 9843227 | Power supply device, and control method of power supply device | Koichi Nose, Yoshifumi Ikenaga, Yoichi Yoshida | 2017-12-12 |
| 8653861 | Control voltage generating circuit, constant current source circuit, and delay circuit and logic circuit including the same | Koichi Nose | 2014-02-18 |
| 8570056 | Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection method | Yoshio Kameda, Masamoto Tago, Yoshihiro Nakagawa | 2013-10-29 |
| 8536890 | Semiconductor inspecting device and semiconductor inspecting method | Yoshio Kameda, Masamoto Tago, Yoshihiro Nakagawa | 2013-09-17 |
| 8513970 | Semiconductor device and method of testing the same | Yoshio Kameda, Yoshihiro Nakagawa, Masayuki Mizuno, Koichi Nose | 2013-08-20 |
| 8441277 | Semiconductor testing device, semiconductor device, and testing method | Yoshio Kameda, Koichi Nose, Masayuki Mizuno, Toshinobu Ono | 2013-05-14 |
| 8399960 | Semiconductor device | Yoshihiro Nakagawa, Yoshio Kameda, Masayuki Mizuno | 2013-03-19 |