TT

Tamaki Toumiya

NE Nec: 2 patents #5,510 of 14,502Top 40%
NE Nec Electronics: 1 patents #715 of 1,789Top 40%
Overall (All Time): #1,604,858 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6751767 Test pattern compression method, apparatus, system and storage medium 2004-06-15
6425104 Method and system for test pattern generation and a computer readable medium instructing the system to perform the method 2002-07-23
6334199 Method of generating test patterns for a logic circuit, a system performing the method, and a computer readable medium instructing the system to perform the method Toshinobu Ono 2001-12-25