Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for measuring lifetime of minority carriers in semiconductor

Method and apparatus for measuring lifetime of minority carriers in semiconductor

US Patent 5444389 · Granted Aug 22, 1995

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Polymer gel having sponge-like porous structure2025
Process for producing low-concentration gel using gel-precursor clusters, and ge2020
Apparatus for supporting substrate, apparatus for measuring surface potential, a2011
Substrate treatment method and substrate treatment apparatus2009
Optical disk device2009
Substrate processing apparatus2009
Substrate processing apparatus2008
Substrate processing apparatus2007
Land pre-pit address demodulating device2007
Substrate processing apparatus comprising ring-shaped motor2006
Substrate processing apparatus2005
Substrate cleaning apparatus2005