Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage

Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage

US Patent 5264705 · Granted Nov 23, 1993

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Charged particle beam apparatus and control method of charged particle beam appa2023
Scanning electron microscope and measurement method for obtaining images of a sp2020
Electronic component casing2016
Electron microscope2011
Method of analysis using energy loss spectrometer and transmission electron micr2008
Heat dissipation assembly and method for producing the same2007
TEM sample equipped with an identifying function, focused ion beam device for pr2006
Insulation sheet and apparatus utilizing the same2006
Electron beam apparatus having electron analyzer and method of controlling lense2006
Transmission electron microscope equipped with energy filter2004
Energy filter2003
Transmission electron microscope equipped with energy filter2003