YI

Yu Ishibashi

JE Jeol: 2 patents #192 of 669Top 30%
Overall (All Time): #2,305,568 of 4,157,543Top 60%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5264705 Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage Toshikazu Honda, Mikio Naruse, Toshikatsu Kaneyama, Ikuya Nishimura 1993-11-23
4626689 Electron beam focusing system for electron microscope Takeshi Tomita 1986-12-02