Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11640894 | Charged particle beam apparatus and control method of charged particle beam apparatus | — | 2023-05-02 |
| 10879035 | Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beam | Noriaki Mizuno | 2020-12-29 |
| 7977630 | Electron microscope | — | 2011-07-12 |
| 7459680 | Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith | — | 2008-12-02 |
| 7030389 | Electron beam apparatus having electron analyzer and method of controlling lenses | — | 2006-04-18 |
| 6720558 | Transmission electron microscope equipped with energy filter | — | 2004-04-13 |
| 6586737 | Transmission electron microscope equipped with energy filter | — | 2003-07-01 |
| 6573501 | Holography transmission electron microscope | Hiromi Nunome, Masaki Takeguchi | 2003-06-03 |
| 6483110 | Electron beam energy filter | — | 2002-11-19 |
| 6140642 | Imaging energy filter equipped with distortion corrector | Toshikazu Honda, Michiyoshi Tanaka, Masami Terauchi, Kenji Tsuda | 2000-10-31 |
| 5952656 | Energy filter | — | 1999-09-14 |
| 5264705 | Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage | Toshikazu Honda, Mikio Naruse, Yu Ishibashi, Ikuya Nishimura | 1993-11-23 |
| 5258617 | Method and apparatus for correcting axial coma in electron microscopy | Toshikazu Honda | 1993-11-02 |