Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect offset correction for examination of semiconductor specimens

Defect offset correction for examination of semiconductor specimens

US Patent 12498333 · Granted Dec 16, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Defect examination on a semiconductor specimen2025
Machine learning-based classification of defects in a semiconductor specimen2025
Method of deep learning-based examination of a semiconductor specimen and system2024
Mask inspection of a semiconductor specimen2024
Selecting a representative subset of potential defects to improve defect classif2024
Detecting defects in semiconductor specimens using weak labeling2023
Determining a critical dimension variation of a pattern2023
Method of deep learning-based examination of a semiconductor specimen and system2023
Fingerprint identification apparatus2022
Calibration method for current detection and protection mechanism and calibratio2022
Product detection device, product detection system and product detection method 2022
Machine learning-based defect detection of a specimen2022