Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12498333 | Defect offset correction for examination of semiconductor specimens | Alan Lin Kao, Shun-Fu Yang, Boaz Cohen, Yen Cheng Chiang, Chun-Wen Lai +1 more | 2025-12-16 |
| 11462049 | Fingerprint identification apparatus | Jhe-Syuan Lin, CHIA-MING YEH, Wen-Chen Lee, Chia-Yuan Hsiao | 2022-10-04 |