Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for evaluating non-uniform stress

Method for evaluating non-uniform stress

US Patent 12374588 · Granted Jul 29, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Etch stop layer for semiconductor devices2025
Film deposition for patterning process2025
Method of manufacturing semiconductor devices2025
Method of manufacturing semiconductor devices2025
Alignment mark for MRAM device and method2025
Alignment mark for MRAM device and method2025
Feature patterning using pitch relaxation and directional end-pushing with ion b2025
Dual critical dimension patterning2025
Patterning material including silicon-containing layer and method for semiconduc2025
Method for inspecting pattern defects2025
Method of forming an interconnect structure having an air gap and structure ther2024
Backside gate contact, backside gate etch stop layer, and methods of forming sam2024