Automated application of drift correction to sample studied under electron microscope

Assignee

• Protochips

Inventors

• Franklin Stampley Walden, II (30 patents)
• John Damiano, Jr. (67 patents)
• David P. Nackashi (45 patents)
• Daniel Stephen Gardiner (36 patents)
• Mark Uebel (30 patents)
• Alan Philip Franks (11 patents)
• Benjamin Jacobs (9 patents)
• Joshua Friend (7 patents)
• Katherine Elizabeth Marusak (6 patents)
• Nelson L. Marthe, JR. (3 patents)
• Benjamin Bradshaw Larson (3 patents)

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