Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12284445 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more | 2025-04-22 |
| 11902665 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more | 2024-02-13 |
| 11514586 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more | 2022-11-29 |