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Benjamin Jacobs — 9 Patents

PRProtochips: 8 patents #9 of 22Top 45%
Apex, NC: #253 of 1,394 inventorsTop 20%
North Carolina: #5,916 of 45,564 inventorsTop 15%
Overall (All Time): #535,341 of 4,157,543Top 15%
9 Patents All Time
Benjamin Jacobs has been granted 9 US patents while listed as an inventor at Protochips. The first was granted in 2021 and the most recent in July 2025. Benjamin Jacobs ranks #535,341 of 4,157,543 US inventors in our database (top 12.9%). Patent records list Benjamin Jacobs in Apex, NC, US.

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDate
12375815 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more 2025-07-29
12341190 Coated single crystalline metal oxide materials and method for producing the same Jin-Myoung Lim, Rodney Dwagne C. Alvarez, Jose Emilio Frausto-Lopez 2025-06-24
12284445 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more 2025-04-22
12010430 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more 2024-06-11
11902665 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more 2024-02-13
11514586 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more 2022-11-29
11477388 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more 2022-10-18
11399138 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more 2022-07-26
10986279 Automated application of drift correction to sample studied under electron microscope Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more 2021-04-20

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