| 12375815 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more |
2025-07-29 |
| 12284445 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more |
2025-04-22 |
| 12130858 |
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +2 more |
2024-10-29 |
| 12010430 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more |
2024-06-11 |
| 11902665 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more |
2024-02-13 |
| 11755639 |
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +2 more |
2023-09-12 |
| 11514586 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more |
2022-11-29 |
| 11477388 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more |
2022-10-18 |
| 11455333 |
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +2 more |
2022-09-27 |
| 11399138 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more |
2022-07-26 |
| 10986279 |
Automated application of drift correction to sample studied under electron microscope |
Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more |
2021-04-20 |