Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Machine learning based examination of a semiconductor specimen and training thereof

Machine learning based examination of a semiconductor specimen and training thereof

US Patent 12260543 · Granted Mar 25, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

End-to-end measurement for semiconductor specimens2025
Generating training data usable for examination of a semiconductor specimen2024
Determination of defects and/or edge roughness in a specimen based on a referenc2023
Determination of defects and/or edge roughness in a specimen based on a referenc2023
Segmentation of an image of a semiconductor specimen2023
Segmentation of an image of a semiconductor specimen2023
Segmentation of an image of a semiconductor specimen2023
Generating training data usable for examination of a semiconductor specimen2022
Determining locations of suspected defects2022
Generating a training set usable for examination of a semiconductor specimen2022
Generating a training set usable for examination of a semiconductor specimen2022
Generating a training set usable for examination of a semiconductor specimen2022