Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Determining locations of suspected defects

Determining locations of suspected defects

US Patent 11301987 · Granted Apr 12, 2022

Estimated economic value: $58,287,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection and estimation of defects in vehicle's exterior2025
Machine learning based examination of a semiconductor specimen and training ther2025
Detection and estimation of defects in vehicle's exterior2025
Segmentation of an image of a semiconductor specimen2023
Generating a training set usable for examination of a semiconductor specimen2022
Review of suspected defects using one or more reference dies2017
System and method for scanning an object2016
Dispenser2008
Holder2007
Dispenser2007
Holder2007
Holder2007