Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Total reflection x-ray fluorescence spectrometer

Total reflection x-ray fluorescence spectrometer

US Patent 11867646 · Granted Jan 9, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Damage measurement method, apparatus and program, and x-ray diffraction apparatu2025
Transmissive small-angle scattering device2025
Scattering measurement analysis method, scattering measurement analysis device, 2024
X-ray spectrometer and pulse height prediction program2024
Transmissive small-angle scattering device2024
Imaging type X-ray microscope2024
Imaging type X-ray microscope2024
Transmissive small-angle scattering device2023
Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors a2023
X-ray generation device and X-ray analysis apparatus2023
Analysis method for fine structure, and apparatus and program thereof2022
Photoalignment method and photoalignment device2022