{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Contact and socket device for burning-in and testing semiconductor IC", "item": "https://www.patentleaderboard.com/patent/11668744"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Contact and socket device for burning-in and testing semiconductor IC

Contact and socket device for burning-in and testing semiconductor IC

US Patent 11668744 · Granted Jun 6, 2023

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Socket device for testing ICS2025
Socket device for testing ICS2025
Socket device for testing ICS2025
Lidless BGA socket apparatus for testing semiconductor device2025
Lidless BGA socket apparatus for testing semiconductor device2025
Lidless BGA socket apparatus for testing semiconductor device2025
Spring contact and socket having spring contact embedded therein2024
Spring contact and socket having spring contact embedded therein2024
Spring contact and socket having spring contact embedded therein2024
Spring contact and test socket with same2024
Spring contact and test socket with same2024
Spring contact and test socket with same2024