| 12392798 |
Socket device for testing ICS |
Dong Weon Hwang, Logan Jae Hwang |
2025-08-19 |
| 12248001 |
Lidless BGA socket apparatus for testing semiconductor device |
Dong Weon Hwang, Logan Jae Hwang |
2025-03-11 |
| 12061212 |
Spring contact and socket having spring contact embedded therein |
Dong Weon Hwang, Logan Jae Hwang |
2024-08-13 |
| 11982688 |
Spring contact and test socket with same |
Dong Weon Hwang, Logan Jae Hwang |
2024-05-14 |
| 11668744 |
Contact and socket device for burning-in and testing semiconductor IC |
Dong Weon Hwang, Logan Jae Hwang |
2023-06-06 |
| 11561241 |
Spring contact and test socket with same |
Dong Weon Hwang, Logan Jae Hwang |
2023-01-24 |
| 11486896 |
Contact and test socket device for testing semiconductor device |
Dong Weon Hwang, Jae Suk Hwang |
2022-11-01 |
| 11486897 |
Contact and test socket device for testing semiconductor device |
Dong Weon Hwang, Jae Suk Hwang |
2022-11-01 |
| 11387584 |
Contact pin for testing semiconductor IC for high speed signal, spring contact including same, and socket device |
Dong Weon Hwang, Logan Jae Hwang |
2022-07-12 |
| 10971843 |
BGA socket device for testing BGA IC |
Dong Weon Hwang, Logan Jae Hwang |
2021-04-06 |
| 10955438 |
Contact and socket device for testing semiconductor |
Dong Weon Hwang, Logan Jae Hwang |
2021-03-23 |
| 10935572 |
Contact and test socket device for testing semiconductor device |
Dong Weon Hwang, Jae Suk Hwang |
2021-03-02 |
| 10761110 |
Contact for testing semiconductor device, and test socket device therefor |
Dong Weon Hwang, Jae Suk Hwang |
2020-09-01 |
| 10466273 |
Socket device for testing IC |
Dong Weon Hwang, Logan Jae Hwang |
2019-11-05 |
| 10241132 |
Socket apparatus for semiconductor device test |
Dong Weon Hwang, Jae Suk Hwang |
2019-03-26 |
| 10094852 |
Spring contact |
Dong Weon Hwang, Jae Suk Hwang |
2018-10-09 |
| 9494616 |
Socket device for testing semiconductor device |
Dong Weon Hwang, Jae Suk Hwang |
2016-11-15 |