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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
JH

Jae Baek Hwang — 17 Patents

UNUnknown: 15 patents #358 of 83,584Top 1%
HCHicon Co.: 8 patents #2 of 4Top 50%
Seongnam-si, KR: #494 of 4,833 inventorsTop 15%
Overall (All Time): #263,971 of 4,157,543Top 7%
17 Patents All Time
Jae Baek Hwang has been granted 17 US patents while listed as an inventor at Unknown. The first was granted in 2016 and the most recent in August 2025. Jae Baek Hwang ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Jae Baek Hwang in Seongnam-si, KR.

Patents per Year

Patents granted per year, 2016 to 2025Bar chart with a peak of 3 patents in 2021.peak 32016: 1 patents20162018: 1 patents20182019: 2 patents20192020: 1 patents20202021: 3 patents20212022: 3 patents20222023: 2 patents20232024: 2 patents20242025: 2 patents2025

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
12392798 Socket device for testing ICS Dong Weon Hwang, Logan Jae Hwang 2025-08-19
12248001 Lidless BGA socket apparatus for testing semiconductor device Dong Weon Hwang, Logan Jae Hwang 2025-03-11
12061212 Spring contact and socket having spring contact embedded therein Dong Weon Hwang, Logan Jae Hwang 2024-08-13
11982688 Spring contact and test socket with same Dong Weon Hwang, Logan Jae Hwang 2024-05-14
11668744 Contact and socket device for burning-in and testing semiconductor IC Dong Weon Hwang, Logan Jae Hwang 2023-06-06
11561241 Spring contact and test socket with same Dong Weon Hwang, Logan Jae Hwang 2023-01-24
11486897 Contact and test socket device for testing semiconductor device Dong Weon Hwang, Jae Suk Hwang 2022-11-01
11486896 Contact and test socket device for testing semiconductor device Dong Weon Hwang, Jae Suk Hwang 2022-11-01
11387584 Contact pin for testing semiconductor IC for high speed signal, spring contact including same, and socket device Dong Weon Hwang, Logan Jae Hwang 2022-07-12
10971843 BGA socket device for testing BGA IC Dong Weon Hwang, Logan Jae Hwang 2021-04-06
10955438 Contact and socket device for testing semiconductor Dong Weon Hwang, Logan Jae Hwang 2021-03-23
10935572 Contact and test socket device for testing semiconductor device Dong Weon Hwang, Jae Suk Hwang 2021-03-02
10761110 Contact for testing semiconductor device, and test socket device therefor Dong Weon Hwang, Jae Suk Hwang 2020-09-01
10466273 Socket device for testing IC Dong Weon Hwang, Logan Jae Hwang 2019-11-05
10241132 Socket apparatus for semiconductor device test Dong Weon Hwang, Jae Suk Hwang 2019-03-26
10094852 Spring contact Dong Weon Hwang, Jae Suk Hwang 2018-10-09
9494616 Socket device for testing semiconductor device Dong Weon Hwang, Jae Suk Hwang 2016-11-15