| 12392798 |
Socket device for testing ICS |
Dong Weon Hwang, Jae Baek Hwang |
2025-08-19 |
| 12248001 |
Lidless BGA socket apparatus for testing semiconductor device |
Dong Weon Hwang, Jae Baek Hwang |
2025-03-11 |
| 12061212 |
Spring contact and socket having spring contact embedded therein |
Dong Weon Hwang, Jae Baek Hwang |
2024-08-13 |
| 11982688 |
Spring contact and test socket with same |
Dong Weon Hwang, Jae Baek Hwang |
2024-05-14 |
| 11668744 |
Contact and socket device for burning-in and testing semiconductor IC |
Dong Weon Hwang, Jae Baek Hwang |
2023-06-06 |
| 11561241 |
Spring contact and test socket with same |
Dong Weon Hwang, Jae Baek Hwang |
2023-01-24 |
| 11387584 |
Contact pin for testing semiconductor IC for high speed signal, spring contact including same, and socket device |
Dong Weon Hwang, Jae Baek Hwang |
2022-07-12 |
| 10971843 |
BGA socket device for testing BGA IC |
Dong Weon Hwang, Jae Baek Hwang |
2021-04-06 |
| 10955438 |
Contact and socket device for testing semiconductor |
Dong Weon Hwang, Jae Baek Hwang |
2021-03-23 |
| 10466273 |
Socket device for testing IC |
Dong Weon Hwang, Jae Baek Hwang |
2019-11-05 |