Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392798 | Socket device for testing ICS | Dong Weon Hwang, Jae Baek Hwang | 2025-08-19 |
| 12248001 | Lidless BGA socket apparatus for testing semiconductor device | Dong Weon Hwang, Jae Baek Hwang | 2025-03-11 |
| 12061212 | Spring contact and socket having spring contact embedded therein | Dong Weon Hwang, Jae Baek Hwang | 2024-08-13 |
| 11982688 | Spring contact and test socket with same | Dong Weon Hwang, Jae Baek Hwang | 2024-05-14 |
| 11668744 | Contact and socket device for burning-in and testing semiconductor IC | Dong Weon Hwang, Jae Baek Hwang | 2023-06-06 |
| 11561241 | Spring contact and test socket with same | Dong Weon Hwang, Jae Baek Hwang | 2023-01-24 |
| 11387584 | Contact pin for testing semiconductor IC for high speed signal, spring contact including same, and socket device | Dong Weon Hwang, Jae Baek Hwang | 2022-07-12 |
| 10971843 | BGA socket device for testing BGA IC | Dong Weon Hwang, Jae Baek Hwang | 2021-04-06 |
| 10955438 | Contact and socket device for testing semiconductor | Dong Weon Hwang, Jae Baek Hwang | 2021-03-23 |
| 10466273 | Socket device for testing IC | Dong Weon Hwang, Jae Baek Hwang | 2019-11-05 |