Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392798 | Socket device for testing ICS | Logan Jae Hwang, Jae Baek Hwang | 2025-08-19 |
| 12248001 | Lidless BGA socket apparatus for testing semiconductor device | Logan Jae Hwang, Jae Baek Hwang | 2025-03-11 |
| 12061212 | Spring contact and socket having spring contact embedded therein | Logan Jae Hwang, Jae Baek Hwang | 2024-08-13 |
| 11982688 | Spring contact and test socket with same | Logan Jae Hwang, Jae Baek Hwang | 2024-05-14 |
| 11668744 | Contact and socket device for burning-in and testing semiconductor IC | Logan Jae Hwang, Jae Baek Hwang | 2023-06-06 |
| 11561241 | Spring contact and test socket with same | Logan Jae Hwang, Jae Baek Hwang | 2023-01-24 |
| 11486896 | Contact and test socket device for testing semiconductor device | Jae Suk Hwang, Jae Baek Hwang | 2022-11-01 |
| 11486897 | Contact and test socket device for testing semiconductor device | Jae Suk Hwang, Jae Baek Hwang | 2022-11-01 |
| 11387584 | Contact pin for testing semiconductor IC for high speed signal, spring contact including same, and socket device | Logan Jae Hwang, Jae Baek Hwang | 2022-07-12 |
| 10971843 | BGA socket device for testing BGA IC | Logan Jae Hwang, Jae Baek Hwang | 2021-04-06 |
| 10955438 | Contact and socket device for testing semiconductor | Logan Jae Hwang, Jae Baek Hwang | 2021-03-23 |
| 10935572 | Contact and test socket device for testing semiconductor device | Jae Suk Hwang, Jae Baek Hwang | 2021-03-02 |
| 10761110 | Contact for testing semiconductor device, and test socket device therefor | Jae Suk Hwang, Jae Baek Hwang | 2020-09-01 |
| 10466273 | Socket device for testing IC | Logan Jae Hwang, Jae Baek Hwang | 2019-11-05 |
| 10241132 | Socket apparatus for semiconductor device test | Jae Suk Hwang, Jae Baek Hwang | 2019-03-26 |
| 10094852 | Spring contact | Jae Suk Hwang, Jae Baek Hwang | 2018-10-09 |
| 9494616 | Socket device for testing semiconductor device | Jae Suk Hwang, Jae Baek Hwang | 2016-11-15 |
| 9435853 | Socket device for an IC test | — | 2016-09-06 |
| 8808038 | Spring contact and a socket embedded with spring contacts | — | 2014-08-19 |
| 8715015 | Structure for a spring contact | — | 2014-05-06 |
| 7918679 | Test and burn-in socket for integrated circuits (ICs) | — | 2011-04-05 |
| 7874863 | Test and burn-in socket for integrated circuits (ICs) | — | 2011-01-25 |
| 7828575 | Test and burn-in socket for integrated circuits (ICS) | — | 2010-11-09 |
| 7601018 | BGA-type test and burn-in socket for integrated circuits (ICs) | — | 2009-10-13 |
| 7025602 | Contact for electronic devices | — | 2006-04-11 |