{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Testing device and method for integrated circuit package", "item": "https://www.patentleaderboard.com/patent/11604211"}]}
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Home › Testing device and method for integrated circuit package

Testing device and method for integrated circuit package

US Patent 11604211 · Granted Mar 14, 2023

Estimated economic value: $13,041,000 ⓘ

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