Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor wafer testing system and related method for improving external magnetic field wafer testing

Semiconductor wafer testing system and related method for improving external magnetic field wafer testing

US Patent 11506706 · Granted Nov 22, 2022

Estimated economic value: $8,627,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device and method for forming the same2025
Testing structure for an integrated chip having a high-voltage device2025
Techniques for heat dispersion in 3D integrated circuit2025
Embedded flash memory device with floating gate embedded in a substrate2025
Planarization-less phase change material switch2025
Embedded memory device with reduced plasma-induced damage and methods of forming2025
Energy harvest and storage device for semiconductor chips and methods for formin2025
Etch stop layer for memory device formation2025
Method and system for scanning a code on a transparent part2025
External magnetic field detection for MRAM device2025
External magnetic field detection for MRAM device2025
Memory device with one-time programmable memory unit and method for fabricating 2025