MS

Meng-Chun Shih

TSMC: 22 patents #1,516 of 12,232Top 15%
Overall (All Time): #187,268 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
12210055 Semiconductor wafer testing system and related method for improving external magnetic field wafer testing Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Chia Yu Wang 2025-01-28
12191262 Package structure and method for fabricating the same Harry-Hak-Lay Chuang, Chia-Hsiang Chen, Ching-Huang Wang, Tien-Wei Chiang 2025-01-07
12040036 Magnetic memory device Chia-Hsiang Chen, Chih-Yang Chang, Chia Yu Wang 2024-07-16
11837312 Magnetic memory device Chia-Hsiang Chen, Chih-Yang Chang, Chia Yu Wang 2023-12-05
11755410 Systems and methods for correcting data errors in memory Yu-Der Chih, Ching-Huang Wang, Yi-Chun Shih, C. Y. Wang 2023-09-12
11749617 Package structure and method for fabricating the same Harry-Hak-Lay Chuang, Chia-Hsiang Chen, Ching-Huang Wang, Tien-Wei Chiang 2023-09-05
11726062 Magnetic layer characterization system and method Chia-Hsiang Chen, Chia Yu Wang 2023-08-15
11726747 Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Chih-Hui Weng, Tien-Wei Chiang +2 more 2023-08-15
11719742 Semiconductor wafer testing system and related method for improving external magnetic field wafer testing Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Chia Yu Wang 2023-08-08
11531524 Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Chih-Hui Weng, Tien-Wei Chiang +2 more 2022-12-20
11506706 Semiconductor wafer testing system and related method for improving external magnetic field wafer testing Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Chia Yu Wang 2022-11-22
11429482 Systems and methods for correcting data errors in memory Yu-Der Chih, Ching-Huang Wang, Yi-Chun Shih, C. Y. Wang 2022-08-30
11380626 Package structure and method for fabricating the same Harry-Hak-Lay Chuang, Chia-Hsiang Chen, Ching-Huang Wang, Tien-Wei Chiang 2022-07-05
11276649 Devices and methods having magnetic shielding layer Harry-Hak-Lay Chuang, Tien-Wei Chiang, Chia-Hsiang Chen, Ching-Huang Wang 2022-03-15
11249131 Test apparatus and testing method using the same Harry-Hak-Lay Chuang, Tien-Wei Chiang, Chia Yu Wang, Ching-Huang Wang, Chih-Yang Chang +2 more 2022-02-15
10936413 Systems and methods for correcting data errors in memory Yu-Der Chih, Ching-Huang Wang, Yi-Chun Shih, C. Y. Wang 2021-03-02
10877089 Semiconductor wafer testing system and related method for improving external magnetic field wafer testing Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Chia Yu Wang 2020-12-29
10818609 Package structure and method for fabricating the same Harry-Hak-Lay Chuang, Chia-Hsiang Chen, Ching-Huang Wang, Tien-Wei Chiang 2020-10-27
10665321 Method for testing MRAM device and test apparatus thereof Chia Yu Wang, Ching-Huang Wang, Chun-Jung Lin, Tien-Wei Chiang, Kuei-Hung Shen 2020-05-26
10228998 Systems and methods for correcting data errors in memory susceptible to data loss when subjected to elevated temperatures Yu-Der Chih, Ching-Huang Wang, Yi-Chun Shih, C. Y. Wang 2019-03-12
10176998 Semiconductor device Chun-Yu Wu, Chin-Huang Wang 2019-01-08
10128313 Non-volatile memory device and structure thereof Chi-Tsai Chen, WenHsien Kuo, Ching-Huang Wang, Chia-Fu Lee, Yu-Der Chih 2018-11-13