Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Position correction method and a system for position correction in relation to four probe resistance measurements

Position correction method and a system for position correction in relation to four probe resistance measurements

US Patent 11131700 · Granted Sep 28, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for determining material parameters of a multilayer test sample2024
Method for measuring high resistivity test samples using voltages or resistances2024
Measuring temperature-modulated properties of a test sample2023
Measuring temperature-modulated properties of a test sample2023
Probe for testing an electrical property of a test sample2023
Probe for testing an electrical property of a test sample2023
Probe for testing an electrical property of a test sample2023
Method for measuring an electric property of a test sample2022
Apparatus for detecting a component in a sample2017
Single-position hall effect measurements2017
Single-position hall effect measurements2017
Method of determining an electrical property of a test sample2014