Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring high resistivity test samples using voltages or resistances of spacings between contact probes

Method for measuring high resistivity test samples using voltages or resistances of spacings between contact probes

US Patent 11946890 · Granted Apr 2, 2024

Estimated economic value: $600,718,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Position correction method and a system for position correction in relation to f2021
Biosensor based on the measurements of clustering dynamics of magnetic particles2017
Biosensor based on measurements of the clustering dynamics of magnetic particles2017