Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11946890 | Method for measuring high resistivity test samples using voltages or resistances of spacings between contact probes | Kristoffer Gram Kalhauge, Mikkel Fougt Hansen | 2024-04-02 |
| 11131700 | Position correction method and a system for position correction in relation to four probe resistance measurements | Alberto Cagliani, Dirch Hjorth Petersen, Ole Hansen | 2021-09-28 |