Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12105136 | Method for determining material parameters of a multilayer test sample | — | 2024-10-01 |
| 11693028 | Probe for testing an electrical property of a test sample | Frederik Westergaard Østerberg, Dirch Hjorth Petersen, Henrik Hartmann Henrichsen, Ole Hansen, Peter Folmer Nielsen | 2023-07-04 |
| 11307245 | Method for measuring an electric property of a test sample | Frederik Westergaard Østerberg, Chia-Hung Wei | 2022-04-19 |
| 11131700 | Position correction method and a system for position correction in relation to four probe resistance measurements | Frederik Westergaard Osterberg, Dirch Hjorth Petersen, Ole Hansen | 2021-09-28 |