Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for determining material parameters of a multilayer test sample

Method for determining material parameters of a multilayer test sample

US Patent 12105136 · Granted Oct 1, 2024

Estimated economic value: $207,169,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe for testing an electrical property of a test sample2023
Method for measuring an electric property of a test sample2022
Position correction method and a system for position correction in relation to f2021