Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Memory array and measuring and testing methods for inter-hamming differences of memory array

Memory array and measuring and testing methods for inter-hamming differences of memory array

US Patent 10838809 · Granted Nov 17, 2020

Estimated economic value: $11,687,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Computer architecture for generating an integrated data repository2025
Scan synchronous-write-through testing architectures for a memory device2025
Memory circuit and write method2025
Systems and methods for classifying puf signature modules of integrated circuits2025
Conducting built-in self-test of memory macro2025
Scan architecture for interconnect testing in 3D integrated circuits2025
Systems and methods to store multi-level data2025
Authentication based on physically unclonable functions2025
Integrated circuit (IC) signatures with random number generator and one-time pro2025
Integrated circuit (IC) signatures with random number generator and one-time pro2025
Integrated circuit layout, integrated circuit, and method for fabricating the sa2025
Buffer control of multiple memory banks2025