Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope

Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope

US Patent 10539591 · Granted Jan 21, 2020

Estimated economic value: $25,640,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measuring device for a scanning probe microscope and method for scanning probe m2021
Solar testing device2019
Apparatus and a method for investigating a sample by means of several investigat2015
Method and apparatus for the combined analysis of a sample with objects to be an2014
Method and apparatus for the combined analysis of a sample with objects to be an2014
Method for examining a measurement object, and apparatus2014
Device for receiving a test sample2013
Measuring probe device for a probe microscope, measuring cell and scanning probe2013
Measuring probe device for a probe microscope, measuring cell and scanning probe2013
Method and apparatus for characterizing a sample with two or more optical traps2013
Method for examining a test sample using a scanning probe microscope, measuremen2013
Method for the operation of a measurement system with a scanning probe microscop2013