TJ

Torsten Jähnke

JA Jpk Instruments Ag: 10 patents #1 of 19Top 6%
BN Bruker Nano: 1 patents #76 of 148Top 55%
Overall (All Time): #454,625 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10539591 Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope Detlef Knebel, Jonas Hiller 2020-01-21
9080937 Apparatus and a method for investigating a sample by means of several investigation methods Gerd Behme, Tilo Jankowski 2015-07-14
8898809 Method and apparatus for the combined analysis of a sample with objects to be analyzed Torsten Müller, Kathryn Anne Poole, Detlef Knebel 2014-11-25
8769711 Method for examining a measurement object, and apparatus 2014-07-01
8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope Torsten Müller, Kathryn Anne Poole, Detlef Knebel 2013-08-06
8381311 Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system 2013-02-19
8368017 Method for the operation of a measurement system with a scanning probe microscope and a measurement system Michael Richard Haggerty 2013-02-05
7971266 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope Torsten Müller, Detlef Knebel, Kathryn Anne Poole 2011-06-28
7934323 Method and a device for the positioning of a displaceable component in an examining system Detlef Knebel 2011-05-03
7473894 Apparatus and method for a scanning probe microscope Detlef Knebel, Olaf Sünwoldt 2009-01-06
7022985 Apparatus and method for a scanning probe microscope Detlef Knebel, Olaf Sünwoldt 2006-04-04