DK

Detlef Knebel

JA Jpk Instruments Ag: 10 patents #1 of 19Top 6%
BN Bruker Nano: 2 patents #54 of 148Top 40%
Overall (All Time): #412,711 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11156632 Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscope Tilo Jankowski, Frederik Büchau 2021-10-26
10539591 Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope Torsten Jähnke, Jonas Hiller 2020-01-21
8898809 Method and apparatus for the combined analysis of a sample with objects to be analyzed Torsten Müller, Kathryn Anne Poole, Torsten Jähnke 2014-11-25
8506909 Device for receiving a test sample Olaf Sünwoldt 2013-08-13
8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope Torsten Jähnke, Torsten Müller, Kathryn Anne Poole 2013-08-06
8415613 Method and apparatus for characterizing a sample with two or more optical traps Sven-Peter Heyn, Jacob Kerssemakers, Helge Eggert, Torsten Jaehnke, Joern Kamps 2013-04-09
7971266 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope Torsten Jähnke, Torsten Müller, Kathryn Anne Poole 2011-06-28
7934323 Method and a device for the positioning of a displaceable component in an examining system Torsten Jähnke 2011-05-03
7473894 Apparatus and method for a scanning probe microscope Torsten Jähnke, Olaf Sünwoldt 2009-01-06
7442922 Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology Matthias Amrein, Klaus Dreisewerd 2008-10-28
7155962 Method and apparatus to study a surfactant Matthias Amrein 2007-01-02
7022985 Apparatus and method for a scanning probe microscope Torsten Jähnke, Olaf Sünwoldt 2006-04-04