Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for characterizing a sample with two or more optical traps

Method and apparatus for characterizing a sample with two or more optical traps

US Patent 8415613 · Granted Apr 9, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for scanning microscopy and scanning microscope2022
Method for generating an overview image using a large aperture objective2022
Measuring device for a scanning probe microscope and method for scanning probe m2021
Method for scanning microscopy and scanning microscope2021
Measuring device for a scanning probe microscope, scanning probe microscope and 2020
Method and apparatus for the combined analysis of a sample with objects to be an2014
Device for receiving a test sample2013
Measuring probe device for a probe microscope, measuring cell and scanning probe2013
Method for providing a probe for a probe-microscopic analysis of a test sample i2011
Method and a device for the positioning of a displaceable component in an examin2011
Apparatus and method for a scanning probe microscope2009
Method for locally highly resolved, mass-spectroscopic characterization of surfa2008